US Patent Issued to Micron Technology on Dec. 30 for "Classification of error rate of data retrieved from memory cells" (California Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,512,857, issued on Dec. 30, was assigned to Micron Technology Inc. (Boise, Idaho).

"Classification of error rate of data retrieved from memory cells" was invented by Sivagnanam Parthasarathy (Carlsbad, Calif.), James Fitzpatrick (Laguna Niguel, Calif.), Patrick Robert Khayat (San Diego) and AbdelHakim S. Alhussien (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory sub-system configured to: measure a plurality of sets of signal and noise characteristics of a group of memory cells in a memory device; determine a plurality of optimized read voltages of the group of memory cells from the plurality of sets of signal and noise character...