US Patent Issued to Micron Technology on Dec. 23 for "Power loss error detection using partial block handling" (California Inventors)

ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,505,899, issued on Dec. 23, was assigned to Micron Technology Inc. (Boise, Idaho).

"Power loss error detection using partial block handling" was invented by Peng Zhang (Los Altos, Calif.), Lei Lin (Fremont, Calif.), Zhongguang Xu (San Jose, Calif.), Li-Te Chang (San Jose, Calif.), Zhengang Chen (San Jose, Calif.), Murong Lang (San Jose, Calif.) and Zhenming Zhou (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "In some implementations, a memory device may determine that a power loss has occurred. The memory device may determine a last written page (LWP) location associated with an LWP of a block of a memory of the memory device. The memor...