US Patent Issued to Micron Technology on Dec. 2 for "Mitigating disturbance of digit lines at plate edges" (California Inventor)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,488,822, issued on Dec. 2, was assigned to Micron Technology Inc. (Boise, Idaho).

"Mitigating disturbance of digit lines at plate edges" was invented by Makoto Kitagawa (Folsom, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for mitigating disturbance of digit lines at plate edges are described. Generally, the described techniques relate to disturbance mitigation for one or more memory cells of a sub-array associated with an unselected digit lines located at an edge of the sub-array by including an additional shunt configured to selectively couple the edge digit lines with an associated plate line. For example, a cent...