US Patent Issued to Micron Technology on Dec. 16 for "Efficient performance of error rate detection procedures in a memory system" (Indian Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,499,001, issued on Dec. 16, was assigned to Micron Technology Inc. (Boise, Idaho).

"Efficient performance of error rate detection procedures in a memory system" was invented by Sridhar Prudviraj Gunda (Karnataka, India), Thibash Rajamani Balakrishnan (Karnataka, India), Saurav Pundir (Karnataka, India) and Sunil Singh Dhanik (Karnataka, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for efficient performance of error rate detection procedures in a memory system are described. A memory system may determine whether a condition for performing an error rate detection procedure has been satisfied. Based on determining that...