ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,991, issued on Aug. 5, was assigned to Micron Technology Inc. (Boise, Idaho).
"Error detection event mechanism" was invented by Giuseppe Cariello (Boise, Idaho).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for error detection event mechanism are described. The memory system may identify a fault condition and transmit, to a host system, a message indicating a first indication that the fault condition exists at the memory system. In some cases, the memory system may set, in a register of the memory system, a second indication indicating a type of the fault condition based on identifying the fault condition. The memory sys...