US Patent Issued to Micron Technology on Aug. 26 for "Techniques for enhanced system performance after retention loss" (American, Chinese Inventors)

ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,399,827, issued on Aug. 26, was assigned to Micron Technology Inc. (Boise, Idaho).

"Techniques for enhanced system performance after retention loss" was invented by Chun Sum Yeung (San Jose, Calif.), Deping He (Boise, Idaho) and Min Rui Ma (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for techniques for enhanced system performance after retention loss are described. A memory system may program a page of memory cells in response to receiving a power down notification. As part of the programming, the memory system may record an indication of a voltage threshold of the page and power down for a duration of time, dur...