ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,399,819, issued on Aug. 26, was assigned to Micron Technology Inc. (Boise, Idaho).
"Memory system characteristic control" was invented by Shawn Storm (Boise, Idaho), Joseph A. Oberle (Sunnyvale, Calif.) and Ji-Hye Gale Shin (Palo Alto, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method includes configuring a memory system with a first set of operating characteristics corresponding to a first thermal voltage model, monitoring operation of the memory system, selecting a second thermal voltage model based on the monitored operation of the memory system, configuring the memory system with a second set of operating characteristics corresponding t...