US Patent Issued to Micron Technology on Aug. 12 for "Managing data integrity using a change in a number of data errors and an amount of time in which the change occurred" (Idaho Inventor)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,386,700, issued on Aug. 12, was assigned to Micron Technology Inc. (Boise, Idaho).

"Managing data integrity using a change in a number of data errors and an amount of time in which the change occurred" was invented by Ryan G. Fisher (Boise, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "Exemplary methods, apparatuses, and systems include performing an initial data integrity scan of a subset of memory at an initial time to determine an initial error rate for the subset of memory. The initial error rate and the initial time are stored. A subsequent integrity scan of the subset of memory is performed at a second time to determine a subsequent error r...