US Patent Issued to Micron Technology on Aug. 12 for "Corrective reads with improved recovery from data retention loss" (Japanese, American Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,387,781, issued on Aug. 12, was assigned to Micron Technology Inc. (Boise, Idaho).

"Corrective reads with improved recovery from data retention loss" was invented by Huai-Yuan Tseng (San Ramon, Calif.), Akira Goda (Tokyo), Ching-Huang Lu (Fremont, Calif.), Eric N. Lee (San Jose, Calif.) and Tomoharu Tanaka (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A read is initiated with respect to a target cell. A pair of adjacent cells includes a first cell and a second cell each adjacent to the target cell. First cell state information is obtained for the first cell and second cell state information is obtained for the second cell. A state info...