US Patent Issued to Micron Technology on April 8 for "Performing select gate integrity checks to identify and invalidate defective blocks" (California Inventors)

ALEXANDRIA, Va., April 9 -- United States Patent no. 12,272,418, issued on April 8, was assigned to Micron Technology Inc. (Boise, Idaho).

"Performing select gate integrity checks to identify and invalidate defective blocks" was invented by Zhongguang Xu (San Jose, Calif.), Zhenlei Shen (Milpitas, Calif.) and Murong Lang (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising receiving, from a host system, an enhanced erase command referencing a block; performing a lookup to determine whether the block is marked in a gro...