US Patent Issued to Micron Technology on April 15 for "Modular machine learning models for denoising images and systems and methods for using same" (Idaho Inventors)

ALEXANDRIA, Va., June 5 -- United States Patent no. 12,277,683, issued on April 15, was assigned to Micron Technology Inc. (Boise, Idaho).

"Modular machine learning models for denoising images and systems and methods for using same" was invented by Bambi L DeLaRosa (Boise, Idaho), Katya Giannios (Boise, Idaho) and Abhishek Chaurasia (Boise, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "A machine learning model may be trained to denoise an image. The machine learning model may identify noise in an image of a sequence based at least in part, on at least one other image of the sequence. The machine learning model may include a recurrent neural network. The machine learning model may have a modular archit...