US Patent Issued to Microchip Technology on Jan. 20 for "System and methods for offset and threshold calibration in loss of signal detection circuits" (Indian Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,531,641, issued on Jan. 20, was assigned to Microchip Technology Inc. (Chandler, Ariz.).

"System and methods for offset and threshold calibration in loss of signal detection circuits" was invented by Rapina Siva Kumar (Karnataka, India) and Shashi Jain (Karnataka, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "Communication circuits and systems may include circuitry to detect the loss of the input signal. These circuits may be termed Loss of Signal (LOS) circuits. Changes to channel length and frequency of transmission may introduce uncertainty in detection circuits. A system may include a offset calibration mode and a hysteresis calibration mode ...