ALEXANDRIA, Va., March 26 -- United States Patent no. 12,259,983, issued on March 25, was assigned to Micro Focus LLC (Santa Clara, Calif.).

"Sensitive information discovery and test component configuration" was invented by Alexander Hoole (Santa Clara, Calif.), Ali ElKortobi (Spring Branch, Texas), Reiner Kappenberger (Groveland, Calif.) and Domingo Juan Rivera (Holly Springs, N.C.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Testing software applications often requires a balancing of thoroughness versus the time and computing resources available to perform such tests. Certain data handling operations may potentially expose data to unauthorized parties. However, not all data is equal; some data requires a...