US Patent Issued to Mettler-Toledo Safeline X-Ray on Jan. 13 for "Method for handling product settings of operating parameters of a product inspection system, product inspection system and computer program" (British Inventor)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,994, issued on Jan. 13, was assigned to Mettler-Toledo Safeline X-Ray Ltd. (Royston, Great Britain).

"Method for handling product settings of operating parameters of a product inspection system, product inspection system and computer program" was invented by Nick Bridger (Kettering, Great Britain).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods and related systems for handling product settings of operating parameters of a product inspection system are disclosed. A radiation unit for causing radiation to impinge onto a subject product and a detector unit for detecting the radiation transmitted through or reflected from the subject product are c...