ALEXANDRIA, Va., March 19 -- United States Patent no. 12,254,660, issued on March 18, was assigned to Metrostudy Inc. (Newport Beach, Calif.).
"System and method for home facade feature measurement in a geographic region" was invented by Sivakumaran Somasundaram (Glasgow, Great Britain), Ali Salman (Glasgow, Great Britain), Avnish Kumar (Glasgow, Great Britain), Ian Michael Scott (Aberdeen, Great Britain) and Todd Alan Tomalak (De Pere, Wis.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method including receiving a first set of one or more street level images of houses into a Machine Learned Model trained with a second set of street level images with one or more exterior features of the houses labeled, id...