US Patent Issued to Meta Platforms Technologies on Sept. 23 for "Metasurface for far-field beam characteristic control of micro light emitting diodes" (Washington Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,590, issued on Sept. 23, was assigned to Meta Platforms Technologies LLC (Menlo Park, Calif.).

"Metasurface for far-field beam characteristic control of micro light emitting diodes" was invented by Zhaocheng Liu (Redmond, Wash.) and Zhaoyu Nie (Kenmore, Wash.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A far-field characteristic of light emitted by a micro light emitting diode (MuLED) such as a beam shape, a beam orientation, a beam focusing, or a beam polarization is controlled by a metasurface of nanostructures formed on the MuLED. The metasurface is characterized or defined by a far-field objective function for the emitted light, selection of...