ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,757, issued on July 1, was assigned to Mellanox Technologies Ltd (Yokneam, Israel).
"Decoupling cells testability" was invented by Ido Bourstein (Pardes Hanna-Karkur, Israel) and Idan Avni (Haifa, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit (IC) includes one or more testable voltage decoupling (DCAP) cells. Each of the testable DCAP cells includes (i) one or more decoupling capacitors connected between supply rails of the IC, and (ii) a decoupling-test active logic (DTAL) circuit, which has a normal input-output response and is configured to deviate from the normal input-output response in response to a fault in the DC...