US Patent Issued to Mellanox Technologies on Jan. 27 for "Device for determining existence of damage in semiconductor device and method related thereto" (Israeli Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,538,802, issued on Jan. 27, was assigned to Mellanox Technologies Ltd. (Yokenam, Israel).

"Device for determining existence of damage in semiconductor device and method related thereto" was invented by Allan Green-Petersen (Yokneam, Israel), Kasper Andersen (Yokneam, Israel), Henrik Ahrendt (Yokneam, Israel) and Thomas Roager (Yokneam, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor device may include a semiconductor substrate, a wire placed along at least a portion of a perimeter of the semiconductor substrate, and processing circuitry connected to the wire, the processing circuitry to, based on a signal from the wire, determine w...