US Patent Issued to MELEXIS TECHNOLOGIES on July 29 for "Reflectivity measurement apparatus and method of measuring reflectivity therefor" (Belgian Inventors)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,372,464, issued on July 29, was assigned to MELEXIS TECHNOLOGIES NV (Tessenderlo, Belgium).

"Reflectivity measurement apparatus and method of measuring reflectivity therefor" was invented by Jos Rennies (Tessenderlo, Belgium) and Luc Buydens (Tessenderlo, Belgium).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a heating appliance comprising a substrate for receiving an item of cookware, a method of measuring reflectivity comprises emitting a time-varying electromagnetic signal from a first side of the substrate, a portion of the time-varying electromagnetic signal propagating through the substrate. Electromagnetic radiation is then received at the fir...