ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,667, issued on Feb. 10, was assigned to MEKTEC Corp. (Tokyo).
"Temperature measurement device" was invented by Shunsuke Tomita (Tokyo), Kenichi Nakayama (Tokyo) and Tomoki Kanayama (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a temperature measurement device which includes: a case; a flexible printed circuit board; and a thermistor element mounting portion, the case integrally has a first case portion, a second case portion, and a holding portion; the flexible printed circuit board has a trunk and a branch divided from the trunk; the trunk is fixed to a first surface of the first case portion; the thermistor element mounting por...