US Patent Issued to MEIDENSHA on July 15 for "Testing system" (Japanese Inventor)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,359,991, issued on July 15, was assigned to MEIDENSHA Corp. (Tokyo).

"Testing system" was invented by Wataru Miyazaki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electric inertia control device of this testing system generates a torque current command signal in such a way that a dynamometer behaves as an inertial body having a prescribed set inertia Jset. The electric inertia control device includes: a target speed setting unit for generating a target speed signal on the basis of a shaft torque detection signal and the set inertia; a speed controller for generating a feedback input signal on the basis of a difference signal between the targ...