US Patent Issued to MediaTek on Oct. 28 for "Chip with power-glitch detection and power-glitch self-testing" (Taiwanese Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,315, issued on Oct. 28, was assigned to MediaTek Inc. (Hsinchu, Taiwan).

"Chip with power-glitch detection and power-glitch self-testing" was invented by Pin-Wen Chen (Hsinchu, Taiwan) and Kuan-Chung Chen (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Power-glitch detection and power-glitch self-testing within a chip is shown. In a chip, a processor has a power terminal, a glitch detector, and a self-testing circuit. The power terminal is configured to receive power. The glitch detector is coupled to the power terminal of the processor for power-glitch detection. The self-testing circuit has a glitch generator and a glitch controlle...