US Patent Issued to MediaTek on June 3 for "Dynamic voltage frequency scaling to reduce test time" (California Inventors)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,320,850, issued on June 3, was assigned to MediaTek Inc. (Hsinchu, Taiwan).

"Dynamic voltage frequency scaling to reduce test time" was invented by Anshul Varma (San Jose, Calif.) and Hsin Chen Chen (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "In an aspect of the disclosure, a method, a computer-readable medium, and an apparatus are provided. The apparatus is used for performing a scan test on a chip. In certain configurations, the apparatus includes an internal voltage source on a same die of the chip. The internal voltage source receives a constant voltage. The internal voltage source generates an internal voltage based on the const...