ALEXANDRIA, Va., July 9 -- United States Patent no. 12,352,781, issued on July 8, was assigned to MediaTek Inc. (Hsinchu, Taiwan).
"Test kit for testing a device under test" was invented by Jing-Hui Zhuang (Hsinchu, Taiwan), Ying-Chou Shih (Hsinchu, Taiwan), Sheng-Wei Lei (Hsinchu, Taiwan), Chang-Lin Wei (Hsinchu, Taiwan), Che-Hsien Huang (Hsinchu, Taiwan), Shih-Chia Chiu (Hsinchu, Taiwan), Yi-Chieh Lin (Hsinchu, Taiwan) and Wun-Jian Lin (Hsinchu, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "This disclosure provides a test kit for testing a device under test (DUT) including a socket structure for containing the DUT, and a plunger assembly detachably coupled with the socket structure. The plunger ass...