US Patent Issued to MAXONE SEMICONDUCTOR on April 8 for "Method for achieving the measuring slip of membrane probes" (Chinese Inventors)

ALEXANDRIA, Va., April 9 -- United States Patent no. 12,270,830, issued on April 8, was assigned to MAXONE SEMICONDUCTOR Co. LTD. (Suzhou, China).

"Method for achieving the measuring slip of membrane probes" was invented by Liangyu Zhao (Suzhou, China), Haichao Yu (Suzhou, China) and Ailin Wang (Suzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention relates to a method for realizing the measuring slip of membrane probe, wherein: an elastomer layer is placed between the rigid acting surface of the membrane probe head and the membrane on which the probe is arranged; on the axial plane of the probe, the elastomer layer takes any axial line passing through the probe as a boundary line...