US Patent Issued to Massachusetts Institute of Technology, THE BROAD INSTITUTE on June 24 for "Single-stranded break detection in double-stranded DNA" (Massachusetts Inventors)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,338,486, issued on June 24, was assigned to Massachusetts Institute of Technology (Cambridge, Mass.) and THE BROAD INSTITUTE INC. (Cambridge, Mass.).

"Single-stranded break detection in double-stranded DNA" was invented by Sarah DiIorio (Cambridge, Mass.), Joshua Elacqua (Cambridge, Mass.), Arnaud Gutierrez (Cambridge, Mass.), Navpreet Ranu (Cambridge, Mass.) and Paul Blainey (Cambridge, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to compositions and methods for detection of single-stranded breaks (SSBs) in dsDNA, including in genomic DNA. Measurement of the precise location of SSB damage in DNA, e.g., genomic DNA...