ALEXANDRIA, Va., Sept. 23 -- United States Patent no. RE50,596, issued on Sept. 23, was assigned to MARVELL ASIA PTE LTD (Singapore).
"On-chip reliability monitor and method" was invented by John A. Fifield (Underhill, Vt.), Eric Hunt-Schroeder (Essex Junction, Vt.) and Mark D. Jacunski (Colchester, Vt.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are an on-chip reliability monitor and method. The monitor includes a test circuit with a test device, a reference circuit with a reference device, and a comparator circuit. The monitor periodically switches from operation in a stress mode, to operation in a test mode, and back. During each stress mode, the test device is subjected to stress conditions ...