US Patent Issued to MARVELL ASIA on Oct. 14 for "Built-in circuit for testing process and layout effects of an integrated circuit die" (Vermont, Florida Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,855, issued on Oct. 14, was assigned to MARVELL ASIA PTE LTD (Singapore).

"Built-in circuit for testing process and layout effects of an integrated circuit die" was invented by Eric D. Hunt-Schroeder (Essex Junction, Vt.), Steven Harley Lamphier (Colchester, Vt.), Dale E. Pontius (Colchester, Vt.) and Christopher Kanyuck (Lakeland, Fla.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit device includes functional circuitry including transistors, and testing circuitry configured to test effects of different layouts of the functional circuitry, relative to physical features of the integrated circuit device, on operation of the transi...