ALEXANDRIA, Va., March 5 -- United States Patent no. 12,241,931, issued on March 4, was assigned to Marvell Asia Pte Ltd (Singapore).

"Method and apparatus for capture clock control to minimize toggling during testing" was invented by Balaji Upputuri (Prakasam, India) and Scott Mack (Rochester, Minn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of testing an integrated circuit device includes detecting a number of integrated clock gates (ICGs) in the device. Each ICG can stop clock propagation in a respective branch of a clock tree of the device. For each detected ICG, an ICG fanout (a number of digital inputs that the output of each ICG can feed) is compared with a threshold number of registers. ...