ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,399,099, issued on Aug. 26, was assigned to Malvern Panalytical Ltd. (Malvern, Great Britain).
"Particle characterization" was invented by Jason Corbett (Malvern, Great Britain) and Alex Malm (Malvern, Great Britain).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of characterising particles in a sample, comprising: obtaining a scattering measurement comprising a time series of measurements of scattered light from a detector, the scattered light produced by the interaction of an illuminating light beam with the sample; producing a corrected scattering measurement, comprising compensating for scattering contributions from contaminants by reducing ...