ALEXANDRIA, Va., June 9 -- United States Patent no. 12,287,189, issued on April 29, was assigned to Magic Leap Inc. (Plantation, Fla.).
"Light field display metrology" was invented by Ivan Li Chuen Yeoh (Wesley Chapel, Fla.), Lionel Ernest Edwin (Hollywood, Fla.) and Samuel A. Miller (Hollywood, Fla.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Examples of a light field metrology system for use with a display are disclosed. The light field metrology may capture images of a projected light field, and determine focus depths (or lateral focus positions) for various regions of the light field using the captured images. The determined focus depths (or lateral positions) may then be compared with intended focus ...