US Patent Issued to Macrotest Semiconductor Technology on Sept. 16 for "Templatized memory pattern generator and method" (Chinese Inventor)

ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,416,669, issued on Sept. 16, was assigned to Macrotest Semiconductor Technology Co. Ltd (Nanjing, China).

"Templatized memory pattern generator and method" was invented by Guoliang Mao (Nanjing, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The templatized memory pattern generator includes a test processor, a simple memory pattern generator, a channel timing & formatter, and a pin electronic. The simple memory pattern generator includes an X address generator, a Y address generator, a D data generator, a SMPG and channel mapping. An input terminal of the channel timing & formatter is connected to the SMPG and channel mapping; and parallel data c...