ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,470,210, issued on Nov. 11, was assigned to MACRONIX International Co. Ltd. (Hsinchu, Taiwan).
"Duty cycle correction method and duty cycle correction apparatus" was invented by Wei-Yi Cheng (Tainan, Taiwan) and Su-Chueh Lo (Hsinchu, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A duty cycle correction method and a duty cycle correction apparatus, adapted for correcting a duty cycle of a clock signal by using a duty cycle adjuster in a high-capacity and high-performance semiconductor product such as a 3D NAND flash, are provided. In the method, the duty cycle is adjusted and input to data pads to generate data signals, wherein the data pads are ...