ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,493,698, issued on Dec. 9, was assigned to MACRONIX INTERNATIONAL Co. LTD. (Hsinchu, Taiwan).

"Scan chain circuit and operation method thereof" was invented by Shih-Chou Juan (Taoyuan, Taiwan), Shao-Yu Wang (New Taipei, Taiwan) and Min-Zhi Ji (Taichung, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A scan chain circuit and an operation method thereof are provided. The scan chain circuit includes a plurality of scan chain units. Each of the scan chain units includes a plurality of input scan flip-flop (SFF) and a comparison circuit. After a plurality of input bit values are operated by a logic circuit, a plurality of actual operation result bit va...