US Patent Issued to LYNCEUS on Sept. 30 for "Real-time AI-based quality assurance for semiconductor production machines" (French Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,860, issued on Sept. 30, was assigned to LYNCEUS SAS (Paris).

"Real-time AI-based quality assurance for semiconductor production machines" was invented by David Meyer (Paris) and Guglielmo Montone (Sceaux, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "The subject matter herein provides for AI-based prediction of production defects in association with a production system, such as a semiconductor manufacturing machine. In one embodiment, a method begins by receiving production data from the production system. The production data typically comprises non-homogeneous machine parameters and maintenance data, quality test data, and product and pro...