US Patent Issued to LUNIT on May 13 for "Method and system for determining abnormality in medical device" (South Korean Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,295,753, issued on May 13, was assigned to LUNIT INC. (Seoul, South Korea).

"Method and system for determining abnormality in medical device" was invented by Donggeun Yoo (Seoul, South Korea), Sanghyup Lee (Seoul, South Korea), Minchul Kim (Seoul, South Korea), Hanjun Lee (Seoul, South Korea) and Sunggyun Park (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for determining an abnormality in a medical device from a medical image is provided. The method for determining an abnormality in a medical device comprises receiving a medical image, and detecting information on at least a part of a target medical device included in the r...