US Patent Issued to LUNIT on Dec. 2 for "Method and system for training machine learning model for detecting abnormal region in pathological slide image" (South Korean Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,488,893, issued on Dec. 2, was assigned to LUNIT INC. (Seoul, South Korea).

"Method and system for training machine learning model for detecting abnormal region in pathological slide image" was invented by Donggeun Yoo (Seoul, South Korea), Jaehong Aum (Seoul, South Korea), Minuk Ma (Seoul, South Korea) and Jeong Un Ryu (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method, performed by at least one processor, for training a machine learning model for detecting an abnormal region in a pathological slide image is disclosed. The method including receiving one or more first pathological slide images, determining, from the received one ...