US Patent Issued to LitePoint on July 1 for "Removing test equipment intermodulation interference and noise from power spectral density measurements" (Chinese, American Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,748, issued on July 1, was assigned to LitePoint Corp. (San Jose, Calif.).

"Removing test equipment intermodulation interference and noise from power spectral density measurements" was invented by Chen Cao (Shanghai), Christian Volf Olgaard (Saratoga, Calif.), Ruizu Wang (Santa Clara, Calif.) and Qingjie Lu (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "An example method includes following operations: (i) receiving a device signal from a device under test (DUT); (ii) setting an attenuation value; (iii) applying the attenuation value to the device signal to produce an attenuated device signal for a frequency spectrum analyzing device, where ...