US Patent Issued to LG INNOTEK on Oct. 14 for "Optical inspection based on repetitive feature comparison" (New Jersey Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,444,068, issued on Oct. 14, was assigned to LG INNOTEK Co. LTD. (Seoul, South Korea).

"Optical inspection based on repetitive feature comparison" was invented by Frederick Seng (Cranbury, N.J.), Harold Hwang (Cranbury, N.J.), Brian Piccione (Cranbury, N.J.) and Kuen-Ting Shiu (Cranbury, N.J.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A computer-based system may quantify, based on the plurality of instances of a feature indicated by image data, an attribute (e.g., a color, a shape, a material, a texture, etc.) of the plurality of instances of the feature. The system may also quantify an attribute of an instance of the feature of the plurality of inst...