US Patent Issued to LG Electronics on Oct. 28 for "Degradation to reference sensitivity" (South Korean Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,457,088, issued on Oct. 28, was assigned to LG Electronics Inc. (Seoul, South Korea).

"Degradation to reference sensitivity" was invented by Jaehyuk Jang (Seoul, South Korea), Suhwan Lim (Seoul, South Korea), Yoonoh Yang (Seoul, South Korea), Sangwook Lee (Seoul, South Korea), Jinyup Hwang (Seoul, South Korea) and Jinwoong Park (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided a UE for performing communication, the UE comprising: at least one transceiver; at least one processor; and at least one computer memory operably connectable to the at least one processor and storing instructions that, based on being executed by ...