US Patent Issued to LG Electronics on July 8 for "Maximum sensitivity degradation for dual connectivity" (South Korean Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,356,381, issued on July 8, was assigned to LG Electronics Inc. (Seoul, South Korea).

"Maximum sensitivity degradation for dual connectivity" was invented by Suhwan Lim (Seoul, South Korea), Yoonoh Yang (Seoul, South Korea), Sangwook Lee (Seoul, South Korea), Jinyup Hwang (Seoul, South Korea) and Jongkeun Park (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided a UE in a wireless communication system, the UE comprising: at least one transceiver; at least one processor; and at least one computer memory operably connectable to the at least one processor and storing instructions that, based on being executed by the at least o...