US Patent Issued to Leiden Measurement Technology on Aug. 5 for "Multiplexed impedance-based detection methods and systems using impedance-encoded particles" (California Inventors)

ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,300, issued on Aug. 5, was assigned to Leiden Measurement Technology LLC (Sunnyvale, Calif.).

"Multiplexed impedance-based detection methods and systems using impedance-encoded particles" was invented by Matthijs Bjorn Marijn Harink (Santa Cruz, Calif.) and Nathan Earl Bramall (Sunnyvale, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Described herein are multiplexed impedance-based detection methods for identifying each type of impedance-encoded particles and systems for performing these methods. Impedance-encoded particles of each type comprise cores having the same structure and producing the same complex electrical impedance signature when...