US Patent Issued to LEICA MICROSYSTEMS CMS on Sept. 23 for "Method for controlling microscopic imaging and corresponding microscope control arrangement and microscope" (German Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,659, issued on Sept. 23, was assigned to LEICA MICROSYSTEMS CMS GMBH (Wetzlar, Germany).

"Method for controlling microscopic imaging and corresponding microscope control arrangement and microscope" was invented by Markus Schechter (Wetzlar, Germany) and Tobias Hessler (Wetzlar, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for controlling microscopic imaging of a microscope includes providing a microscope control arrangement configured for receiving a focusing request and for receiving sample information on a sample to be imaged, wherein the microscope control arrangement activates, upon receipt of a focusing request and after hav...