US Patent Issued to LEICA MICROSYSTEMS CMS on Sept. 16 for "Microscope and method for examining a sample" (German Inventor)

ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,416,797, issued on Sept. 16, was assigned to LEICA MICROSYSTEMS CMS GMBH (Wetzlar, Germany).

"Microscope and method for examining a sample" was invented by Stefan Christ (Schoeffengrund, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A microscope includes: a sample chamber; a microscope stage arranged below the sample chamber for having a sample carrier arranged thereon; a pipetting device for pipetting the sample carrier; and a moving mechanism for moving the pipetting device between a non-operating position in which the pipetting device is arranged outside the sample chamber sample carrier and an operating position in which the pipetting devi...