US Patent Issued to LEICA MICROSYSTEMS CMS on Oct. 14 for "Method and device for examining microscope specimens using optical markers" (German Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,443,025, issued on Oct. 14, was assigned to LEICA MICROSYSTEMS CMS GMBH (Wetzlar, Germany).

"Method and device for examining microscope specimens using optical markers" was invented by Falk Schlaudraff (Butzbach, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A device for examining microscope specimens includes a microscope, wherein the microscope specimens include an object to be examined by the microscope and a specimen carrier holding the object, and wherein the device is configured to calculate a digital identification code of the microscope specimen by fingerprinting the microscope specimen using at least one optical marker in at least one ...