US Patent Issued to LEICA MICROSYSTEMS CMS on May 20 for "Microscopic examination device and method of preparing a sample for microscopic examination" (German Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,303,905, issued on May 20, was assigned to LEICA MICROSYSTEMS CMS GMBH (Wetzlar, Germany).

"Microscopic examination device and method of preparing a sample for microscopic examination" was invented by Sebastian Simmer (Bischoffen, Germany) and Stefan Christ (Schoeffengrund, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention relates to a microscopic examination device comprising a microscope and a sample preparation arrangement for preparing one or more samples to be examined in said microscope, said preparing including pipetting one or more liquids into one or more sample receptacles for said one or more samples, said sample pr...