US Patent Issued to LEICA MICROSYSTEMS CMS on May 20 for "Microscope for microscopic examination of a sample" (German Inventor)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,303,884, issued on May 20, was assigned to LEICA MICROSYSTEMS CMS GMBH (Wetzlar, Germany).

"Microscope for microscopic examination of a sample" was invented by Stefan Christ (Schoeffengrund, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A microscope for microscopic examination of a sample includes: a microscope housing enclosing an illumination optics, a microscope stage, and an imaging optics; an integrated sample chamber located within the microscope housing; and an integrated reagent chamber located within the microscope housing, the integrated reagent chamber supplying a reagent to the sample."

The patent was filed on June 10, 2021, under ...