US Patent Issued to LEICA MICROSYSTEMS CMS on March 4 for "STED microscopy method with improved signal to noise ratio in low photon count imaging conditions" (German Inventors)

ALEXANDRIA, Va., March 5 -- United States Patent no. 12,243,194, issued on March 4, was assigned to LEICA MICROSYSTEMS CMS GMBH (Wetzlar, Germany).

"STED microscopy method with improved signal to noise ratio in low photon count imaging conditions" was invented by Luis Alvarez (Heidelberg, Germany) and Frank Hecht (Mannheim, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention relates to a method for generating a result image. The method comprises the steps of: acquiring a STED image of a sample, the STED image comprising pixels; calculating Fourier coefficients of arrival times for the pixels of the image, resulting in real coefficients representing a first image and in imaginary coef...