ALEXANDRIA, Va., July 30 -- United States Patent no. 12,374,131, issued on July 29, was assigned to LEICA MICROSYSTEMS CMS GMBH (Wetzlar, Germany).
"Optimization of workflows for microscopes" was invented by Frank Sieckmann (Eppingen, Germany) and Constantin Kappel (Schriesheim, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for optimizing a workflow of at least one microscope or microscope system includes a step a) of implementing a workflow by one or more components of at least one microscope and/or microscope system, wherein the workflow comprises a capture of first data. In a step b), a trained model is determined for the workflow, at least in part based on the captured first data."
The...