ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,210,145, issued on Jan. 28, was assigned to LEICA MICROSYSTEMS CMS GMBH (Wetzlar, Germany).
"Single-particle localization microscope" was invented by Marcus Dyba (Wetzlar, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A single-particle localization microscope, including an optical system configured to illuminate a sample region with a sequence of light patterns having spatially different distributions of illumination light adapted to cause a single particle located in the sample region to emit detection light, a detector configured to detect a sequence of intensities of the detection light emerging from the sample region in response to the sequ...